Deriving fault architectures from defect history

نویسندگان

  • Anneliese Amschler Andrews
  • Magnus C. Ohlsson
  • Claes Wohlin
چکیده

As software systems evolve over a series of releases, it becomes important to know which components are stable compared to components that show repeated need for corrective maintenance. The latter is a sign of code decay. Code decay can be due to the deterioration of a single component. In this case it manifests itself in repeated and increasing problems that are local to the component. A second type of code decay is due to repeated problems that become increasingly difficult to fix and are related to interactions between components. That is, components are repeatedly fault-prone in their relationships with each other. The latter requires repairs in multiple components and is a sign of problems with the software architecture of the system. Software architecture problems are by far more costly to fix and thus it is very desirable to identify potential architectural problems early and to track them across multiple releases. To do this, we adapt a reverse architecting technique to defect reports of a series of releases. Fault relationships among system components are identified based on whether they are involved in the same defect report, and for how many defect reports this occurs. There are degrees of fault-coupling between components depending on how often these components are involved in a defect fix. After these fault-coupling relationships between components are extracted, they are abstracted to the subsystem level. We also identify a measure for fault cohesion (i.e. fault-proneness of components locally.) The resulting fault architecture figures show for each release what its most fault-prone relationships are. Comparing across releases makes it possible to see whether some relationships between components are repeatedly fault-prone, indicating an underlying systemic architecture problem. We illustrate our technique on a large commercial system consisting of over 800 KLOC of C, C++, and microcode.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Deriving a fault architecture from defect history

As software systems mature, there is the danger that not only code decays, but software architecture as well. We adapt a reverse architecting technique to defect reports of a series of releases. Relationships among system components are identified based on whether they are involved in the same defect report, and for how many defect reports this occurs. There are degrees of fault-coupling betwee...

متن کامل

Reliability and Performance Evaluation of Fault-aware Routing Methods for Network-on-Chip Architectures (RESEARCH NOTE)

Nowadays, faults and failures are increasing especially in complex systems such as Network-on-Chip (NoC) based Systems-on-a-Chip due to the increasing susceptibility and decreasing feature sizes. On the other hand, fault-tolerant routing algorithms have an evident effect on tolerating permanent faults and improving the reliability of a Network-on-Chip based system. This paper presents reliabili...

متن کامل

The Challenge of Reliability in Future Complex Systems

New issues come from the advent nanometric devices: defect and fault tolerance -at the physical, circuit and most importantly at the system levelis an enabling technology for building reliable nanoelectronic systems. Semiconductor manufacturers are responding to these challenges by introducing a variety of technical innovations, including new manufacture testing methodologies, virtual testing, ...

متن کامل

Novel Defect Terminolgy Beside Evaluation And Design Fault Tolerant Logic Gates In Quantum-Dot Cellular Automata

Quantum dot Cellular Automata (QCA) is one of the important nano-level technologies for implementation of both combinational and sequential systems. QCA have the potential to achieve low power dissipation and operate high speed at THZ frequencies. However large probability of occurrence fabrication defects in QCA, is a fundamental challenge to use this emerging technology. Because of these vari...

متن کامل

Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics

We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemically assembled electronic nanotechnology. Several fault detection configurations are presented to target stuck-at faults, shorts, opens, and connection faults in nanoblocks and switchblocks. The detectability of multiple faults in blocks within the nanofabric is also considered. We present an adaptive recov...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:
  • Journal of Software Maintenance

دوره 12  شماره 

صفحات  -

تاریخ انتشار 2000